Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...
Atomic force microscopy (AFM), a form of scanning probe microscopy, is a technique where a cantilever with a sharp tip is systematically scanned across a sample (biological or material ...
Centro de Física de Materiales (CSIC-UPV/EHU), E-20018 Donostia−San Sebastián, Spain Fisika Aplikatua Saila, University of the Basque Country (UPV/EHU), E-20018 Donostia−San Sebastián, Spain ...
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